Title :
Resolution prediction for bandpass-ΣΔ-modulators using SIMULINK behavior simulation
Author :
Weiler, Dirk ; van den Boom, Thomas ; Hosticka, Bedrich J.
Author_Institution :
Fraunhofer-Inst. of Microelectron. Circuits & Syst., Duisburg, Germany
Abstract :
This paper presents a detailed survey of the impact of circuit non-idealities of bandpass sigma-delta modulators (BP-ΣΔM) affecting the signal-to-noise and distortion ratio (SNDR) and therefor the resolution. The presented results have been developed using SIMULINK behavior simulations of a second order BP-ΣΔM. A behavior simulation has the advantage of a fast simulation of any BP-ΣΔM structure and provides a deeper understanding of the influence on the SNDR. The determined parameters are the sampling jitter AT, the sampling or kT/C-noise, and the OTA non-idealities finite DC gain Av0, gain-bandwidth GBW, slew-rate SR, and OTA-noise Vn.OTA, which are relevant in a switched capacitor realization of the BP-ΣΔM. The simulated results are compared to theoretical values using transfer functions.
Keywords :
circuit noise; circuit simulation; jitter; operational amplifiers; sigma-delta modulation; switched capacitor networks; transfer functions; DC gain; OTA noise; SIMULINK behavioral simulation; bandpass sigma-delta modulator; circuit nonideality; gain-bandwidth product; resolution; sampling jitter; sampling noise; signal-to-noise-and-distortion ratio; slew rate; switched capacitor circuit; transfer function; Capacitors; Circuit simulation; Delta-sigma modulation; Distortion; Jitter; Predictive models; Sampling methods; Signal resolution; Strontium; Transfer functions;
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
DOI :
10.1109/ISCAS.2003.1205562
