• DocumentCode
    3533362
  • Title

    Design and analysis of N-type CNTFET Double Edge Triggered D Flip-Flop based SISO shift register

  • Author

    Ravi, T. ; Kannan, V.

  • Author_Institution
    Sathyabama Univ., Chennai, India
  • fYear
    2011
  • fDate
    28-30 Nov. 2011
  • Firstpage
    628
  • Lastpage
    632
  • Abstract
    This paper enumerates the efficient design and analysis of Serial in serial out (SISO) shift register using N-type CNTFET Double Edge Triggered D Flip-flop. The Flip flop is designed using Ballistic CNTFET (VHDL-AMS model) with the dent of 1nm in resistive load inverter logic. The transient and power analysis are obtained with operating voltage at 0.6V for the Double edge triggered D flip-flop and SISO shift register using system vision tool. There are many issues facing while integrating many number of transistors like short channel effect, power dissipation, scaling of the transistors. To overcome these problems by Considering the carbon nano tube have promising application in the field of electronics. The simulation results are presented, and the power consumptions are compared with the conventional MOSFET design. The comparison of results indicated that the CNTFET based design is capable of efficient power savings.
  • Keywords
    carbon nanotube field effect transistors; flip-flops; logic gates; network synthesis; shift registers; C; MOSFET design; SISO shift register; VHDL-AMS model; n-type ballistic CNTFET double edge triggered D flip-flop; power analysis; power consumption; power dissipation; power saving efficiency; resistive load inverter logic; serial in serial out shift register; short channel effect; system vision tool; transient analysis; transistor scaling; voltage 0.6 V; CNTFETs; Carbon; Electric potential; Electron tubes; Flip-flops; MOSFET circuits; Registers; CNT; CNTFET; Circuit simulation; Design constraints; Double edge triggered D flip flop; SISO shift register;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscience, Engineering and Technology (ICONSET), 2011 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4673-0071-1
  • Type

    conf

  • DOI
    10.1109/ICONSET.2011.6167887
  • Filename
    6167887