DocumentCode
3533397
Title
Modeling test cost of ownership
Author
Dance, Daren L.
fYear
1994
fDate
16-17 May 1994
Firstpage
13
Abstract
Increasing cost of test is a major semiconductor industry issue. This report discusses the total life-cycle cost for a set of test equipment required to test one product or test equipment cost of ownership (COO). This is one of many cost control methods used by the semiconductor industry. Modeling test equipment cost of ownership provides an important tool for identifying, measuring, and responding to the challenges of increasing test cost
Keywords
Circuit testing; Costing; Costs; Electronics industry; Life testing; Process control; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor device testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Economics of Design, Test, and Manufacturing, 1994. Proceedings., Third International Conference on the
Conference_Location
Austin, TX, USA
Print_ISBN
0-8186-6595-5
Type
conf
DOI
10.1109/ICEDTM.1994.496087
Filename
496087
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