Title :
SEU Effects on QCA Circuits
Author :
Mahdavi, Mojdeh ; Amiri, Mohammad Amin ; Mirzakuchaki, Sattar
Author_Institution :
Shahr-e-Qods Branch, Islamic Azad Univ. of Shahryar, Shahr-e-Qods
Abstract :
Quantum cellular automata (QCA) represents an emerging technology at the nano technology level. Nowadays, many applications and design methods of QCA technology are introduced. Defect tolerant design of QCA circuits is a challenging case. Here, we will investigate the effects of single event upsets (SEU) on QCA circuits and the defects which may occur.
Keywords :
cellular automata; logic circuits; logic design; nanotechnology; QCA circuit; defect tolerant design; nano technology; quantum cellular automata; single event upset; Circuits; Electrons; Energy consumption; Polarization; Quantum cellular automata; Quantum dots; Quantum mechanics; Single event upset; Stationary state; Tunneling;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960872
