DocumentCode
3533434
Title
SEU Effects on QCA Circuits
Author
Mahdavi, Mojdeh ; Amiri, Mohammad Amin ; Mirzakuchaki, Sattar
Author_Institution
Shahr-e-Qods Branch, Islamic Azad Univ. of Shahryar, Shahr-e-Qods
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
3
Abstract
Quantum cellular automata (QCA) represents an emerging technology at the nano technology level. Nowadays, many applications and design methods of QCA technology are introduced. Defect tolerant design of QCA circuits is a challenging case. Here, we will investigate the effects of single event upsets (SEU) on QCA circuits and the defects which may occur.
Keywords
cellular automata; logic circuits; logic design; nanotechnology; QCA circuit; defect tolerant design; nano technology; quantum cellular automata; single event upset; Circuits; Electrons; Energy consumption; Polarization; Quantum cellular automata; Quantum dots; Quantum mechanics; Single event upset; Stationary state; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960872
Filename
4960872
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