DocumentCode :
3533468
Title :
Determination of Second-Order Nonlinearities of Thin Films of Low Symmetry
Author :
Kauranen, Martti ; Van Elshocht, S. ; Verbiest, Thierry ; Persoons, A. ; Nuckolls, C. ; Katz, T.J.
Author_Institution :
University of Leuven
fYear :
1998
fDate :
14-18 Sept. 1998
Firstpage :
54
Lastpage :
54
Keywords :
Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 1998. 1998 CLEO/Europe. Conference on
Conference_Location :
Glasgow, Scotland
Print_ISBN :
0-7803-4233X
Type :
conf
DOI :
10.1109/CLEOE.1998.718958
Filename :
718958
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3533468
