DocumentCode
3533639
Title
Focused scintillator array for high resolution gamma ray imaging
Author
Nagarkar, Vivek V. ; Kudrolli, Haris ; Singh, Bipin
Author_Institution
Radiat. Monitoring Devices, Inc., Watertown, MA, USA
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
2769
Lastpage
2776
Abstract
The spatial resolution in small animal pinhole SPECT cameras is limited by parallax errors in the scintillator, particularly towards the edge of the field of view. We have developed a method to overcome the parallax errors in pinhole gamma cameras using a focused cut scintillator. A KrF (λ = 248 nm) excimer laser was used to cut very fine grooves in CsI (Tl) scintillator crystals of thickness between 1 mm to 3 mm. The cuts were made in a manner to form structured columns, oriented focused towards the pinhole collimator, and thereby towards the incoming gamma rays. The thickness of the groves averaged 30 μm which is much thinner than that which can be achieved by a wire saw. Individual pixel columns of thickness between 250 μm and 500 μm were cut. Scanning electron micrographs of the samples the CsI:Tl walls after laser ablation are smooth, and free of debris resulting from ablated particles. This reduces the risk of post-processing damage that might occur during debris removal, and encourages complete coverage by reflective coatings in the grooves. The laser optics and the operating parameters were optimized to achieve such deep and thin cuts and are discussed in this paper. Fixturing apparatus was developed in order to cut the pixels in the desired shape. We also present the performance characteristics of the laser ablated scintillators and data from their use in a multipinhole SPECT system.
Keywords
caesium compounds; collimators; excimer lasers; laser ablation; scanning electron microscopy; single photon emission computed tomography; solid scintillation detectors; thallium; CsI:Tl; debris removal; fixturing apparatus; focused cut scintillator; focused scintillator array; high resolution gamma ray imaging; laser ablation; laser optics; parallax errors; pinhole collimator; pinhole gamma cameras; post-processing damage; reflective coatings; scanning electron micrographs; size 250 mum to 3 mm; small animal pinhole SPECT cameras; wavelength 248 nm; Crystals; Imaging; Laser ablation; Laser beam cutting; Photonics; Pixel; Spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874298
Filename
5874298
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