Title :
VLSI Analog Circuit Fault Diagnostic Correlation Coefficient Analytical Method
Author :
Hu Zhiming ; Xie Yongle ; Li Tianyi
Author_Institution :
Autom. Eng. Sch., Univ. of Electron. & Sci. of Technol., Chengdu
Abstract :
In the paper, an approach based on digital signal processing for VLSI analog circuit fault diagnosis is presented. We firstly filtered the test response by cosine modulation filter banks, then computed energy and correlation of all the sub-band filtering sequence to distill digital character of analog response. The experiment based on international benchmark circuit showed that computing correlation of sub-band filtering sequence suited to diagnose hard fault and soft fault.
Keywords :
VLSI; analogue circuits; channel bank filters; correlation methods; digital signal processing chips; fault diagnosis; VLSI analog circuit fault diagnosis; cosine modulation filter banks; digital signal processing; international benchmark circuit; subband filtering sequence; Analog circuits; Circuit faults; Circuit testing; Digital filters; Digital modulation; Digital signal processing; Fault diagnosis; Filter bank; Filtering; Very large scale integration;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960907
