• DocumentCode
    3534131
  • Title

    Preparation and optical characterization of V2O5 thin films

  • Author

    Vijaya Kumar, Y. ; Reddy, V. Ramana M ; Reddy, K. Narasimha

  • Author_Institution
    Dept. of Phys., Osmania Univ., Hyderabad, India
  • fYear
    2011
  • fDate
    28-30 Nov. 2011
  • Firstpage
    244
  • Lastpage
    246
  • Abstract
    V2O5 thin films are prepared by inorganic sol gel technique and spin coated on glass substrates. These prepared films annealed at 473K and 573K temperatures. The as prepared and annealed films were characterized using XRD and transmittance spectra. These films were found to be polycrystalline in nature. Crystallite size decreases with increase annealing temperature and with increase in annealing temperature the optical band gap increased from 2.34eV to 2.5eV.
  • Keywords
    X-ray diffraction; annealing; sol-gel processing; spin coating; thin films; ultraviolet spectra; vanadium compounds; XRD; annealing; annealing temperature; crystallite size; electron volt energy 2.34 eV to 2.5 eV; glass substrate; inorganic sol gel technique; optical band gap; optical characterization; polycrystalline; spin coating; temperature 473 K to 573 K; thin film; transmittance spectra; Annealing; Glass; Lead; Optical films; Solids; X-ray scattering; Optical properties; V2O5 thin films; inorganic sol gel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoscience, Engineering and Technology (ICONSET), 2011 International Conference on
  • Conference_Location
    Chennai
  • Print_ISBN
    978-1-4673-0071-1
  • Type

    conf

  • DOI
    10.1109/ICONSET.2011.6167931
  • Filename
    6167931
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3534131