Title :
Modeling post-techmapping and post-clustering FPGA circuit depth
Author :
Das, Joydip ; Wilton, Steven J E ; Leong, Philip ; Luk, Wayne
Author_Institution :
Elec. & Comp. Eng., Univ. of British Columbia, Vancouver, BC, Canada
fDate :
Aug. 31 2009-Sept. 2 2009
Abstract :
This paper presents an analytical model that relates FPGA architectural parameters to the expected speed of FPGA implementation. More precisely, the model relates the lookup-table size, cluster size, and number of inputs per cluster to the depth of the circuit after technology mapping and after clustering. Comparison to experimental results with large MCNC circuits shows that our models are accurate. We show how the models can be used in FPGA architectural investigations to complement the more usual experimental approach.
Keywords :
field programmable gate arrays; FPGA architectural parameter; MCNC circuit; cluster size; lookup-table size; post-clustering FPGA circuit depth modeling; post-techmapping FPGA circuit depth modeling; Analytical models; Councils; Delay; Field programmable gate arrays; Integrated circuit interconnections; Logic arrays; Logic circuits; Routing; Table lookup; Technological innovation;
Conference_Titel :
Field Programmable Logic and Applications, 2009. FPL 2009. International Conference on
Conference_Location :
Prague
Print_ISBN :
978-1-4244-3892-1
Electronic_ISBN :
1946-1488
DOI :
10.1109/FPL.2009.5272315