Dynamic Markov Model for reliability evaluation of power electronic systems

Author

Ranjbar, Amir Hossein ; Kiani, Morgan ; Fahimi, Babak

Author_Institution

Univ. of Texas at Dallas (UTD), Dallas, TX, USA

fYear

2011

fDate

11-13 May 2011

Firstpage

1

Lastpage

6

Abstract

In this paper, existing methods for reliability evaluation of power electronic systems at system level are reviewed. Then Dynamic Markov Model (DMM) for reliability evaluation of power electronic system is proposed to solve the shortcomings associated with the existing methods. In order to show the effectiveness of the proposed method, reliability of a Boost Power Factor Correction (PFC) circuit is evaluated. To show the advantage of the proposed method, DMM is compared with the conventional Markov model. Based on the comparison results it is shown that DMM can result in a more trustable metric value for reliability of the system.

Keywords

Markov processes; failure analysis; power electronics; power factor correction; power system reliability; boost power factor correction circuit; dynamic Markov model; power electronic system; reliability evaluation; Circuit faults; Integrated circuit modeling; Integrated circuit reliability; Markov processes; Mathematical model; Power electronics; Dynamic Markov Model (DMM); Failure rate;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Engineering, Energy and Electrical Drives (POWERENG), 2011 International Conference on

Conference_Location

Malaga

ISSN

2155-5516

Print_ISBN

978-1-4244-9845-1

Electronic_ISBN

2155-5516

Type

conf

DOI

10.1109/PowerEng.2011.6036439

Filename

6036439