DocumentCode
3534236
Title
Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits
Author
Nagi, Naveena ; Abraham, Jacob A.
fYear
1994
fDate
16-17 May 1994
Firstpage
142
Abstract
Several methods for testing the dynamic characteristics and the frequency response of analog and mixed-signal circuits include input excitations consisting of single or multiple sine waves, pulses, pseudo/white noise or normal operating signals. These techniques differ widely in the test measurement time and the data processing time required for the frequency response characterization, as well as in their effectiveness for detecting errors. This paper provides a comparative study of the different dynamic testing techniques in terms of the measurement and analysis times as well as test effectiveness
Keywords
Circuit faults; Circuit testing; Costs; Fourier transforms; Frequency response; Logic testing; Medical tests; Sequential analysis; Time measurement; Vehicle dynamics;
fLanguage
English
Publisher
ieee
Conference_Titel
Economics of Design, Test, and Manufacturing, 1994. Proceedings., Third International Conference on the
Conference_Location
Austin, TX, USA
Print_ISBN
0-8186-6595-5
Type
conf
DOI
10.1109/ICEDTM.1994.496102
Filename
496102
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