• DocumentCode
    3534409
  • Title

    Practical noise assessment method

  • Author

    Yang, Zhi ; Natarajan, Anusha ; Zamyatin, Alexander A.

  • Author_Institution
    Toshiba Med. Res. Inst. USA, Inc., Chicago, IL, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    3005
  • Lastpage
    3008
  • Abstract
    Noise assessment is important to image quality evaluation. It is also important to the criteria for terminating an iterative noise reduction process. To make a meaningful assessment among the distracting features throughout the images, we need to find a strategy to separate the pixels in featureless regions from the rest of the image. We proposed a concept of pseudo-standard deviation (PSD). We take the histogram of PSD with fine bins and calculate the moving average of the histogram. The window length of the moving average is obtained from a monotonical function of the maximum histogram peak location (PSD location). The first peak in filtered histogram gives the most representative noise measure as a desired approximation of true standard deviation. The calculated results compare well with the manually measured standard deviation values. Our method is simple and reliable. It is fully automatic, no need for user to specify the regions of interest. It is suited for batch processing or iterative noise reduction processes.
  • Keywords
    filtering theory; iterative methods; medical signal processing; noise measurement; batch processing; filtered histogram; image noise estimation; image quality evaluation; iterative noise reduction process; maximum histogram peak location; practical noise assessment method; pseudostandard deviation; Histograms; Image edge detection; Manuals; Noise; Noise level; Noise measurement; Pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874349
  • Filename
    5874349