• DocumentCode
    353454
  • Title

    Impact of orbital parameters on DEM production by SAR interferometry

  • Author

    Abdelfattah, R. ; Nicolas, J.-M. ; Boussema, M.R.

  • Author_Institution
    LTSIRS Ecole Nat. d´´Ingenieurs de Tunis, Tunisia
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    739
  • Abstract
    The authors are interested to the impact of the orbital parameters on interferometric height calculated in range geometry. They use their exact formulation (Abdelfattah, 98), given the mathematical dependency of the interferogram phase and the target height, in order to extract an analytical estimation of the required orbital parameters accuracy for DEM generation. They propose a quantitative assessment of the effects of a variation in range position, baseline and interferometric phase on the topography. Results of analysis of these effects applied to a test site in Tunisia are presented. They also illustrate the effects by means of SIFI interferometric simulator that they had implemented for this purpose. They demonstrate that uncertainties on orbital parameters, and specially the range baseline component, induce an important errors on topography estimation. These errors, which depends linearly with slant range, could be corrected by using some reference points
  • Keywords
    geophysical techniques; remote sensing by radar; spaceborne radar; synthetic aperture radar; terrain mapping; topography (Earth); DEM production; InSAR; SAR; SAR interferometry; SIFI interferometric simulator; Tunisia; baseline; digital elevation model; geophysical measurement technique; interferometric height; interferometric phase; land surface topography; orbital parameters; radar remote sensing; range geometry; range position; spaceborne radar; synthetic aperture radar; Geometry; Orbital calculations; Phase estimation; Production; Radar imaging; Surfaces; Synthetic aperture radar; Synthetic aperture radar interferometry; Testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.861688
  • Filename
    861688