• DocumentCode
    3534556
  • Title

    Polarization resolved reflections from ordered and bunched silicon nanowire arrays

  • Author

    Khorasaninejad, M. ; Saini, S.S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2012
  • fDate
    6-9 Aug. 2012
  • Firstpage
    178
  • Lastpage
    179
  • Abstract
    Polarization-resolved reflections from ordered and bunched silicon nanowire arrays are measured. Reflections reduce considerably for bunched nanowires for the p-polarized input while not changing considerably for the s-polarized input between the ordered and bunched nanowires.
  • Keywords
    arrays; elemental semiconductors; light polarisation; nanophotonics; nanowires; reflection; semiconductor quantum wires; silicon; Si; bunched silicon nanowire arrays; ordered silicon nanowire arrays; p-polarized input; polarization-resolved reflections; s-polarized input; Absorption; Educational institutions; Nanotechnology; Optimized production technology; Reflection; Silicon; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2012 International Conference on
  • Conference_Location
    Banff, AB
  • ISSN
    2160-5033
  • Print_ISBN
    978-1-4577-1511-2
  • Type

    conf

  • DOI
    10.1109/OMEMS.2012.6318861
  • Filename
    6318861