• DocumentCode
    3534571
  • Title

    Dispersion measurements of optical materials using white light interferometry

  • Author

    Van Engen, A.G. ; Diddams, S.A. ; Clement, T.S.

  • Author_Institution
    Joint Inst. for Lab. Astrophys., Colorado Univ., Boulder, CO, USA
  • fYear
    1998
  • fDate
    3-8 May 1998
  • Firstpage
    211
  • Abstract
    Summary form only given. Because of the broad bandwidth of femtosecond laser pulses, dispersion coefficients are important parameters in femtosecond pulse propagation. Dispersion coefficients of dielectrics and nonlinear materials such as barium borate (BBO) are measured over an extended wavelength range, and improved equations are sought for these materials. Using a white light Michelson interferometer, we measure dispersion coefficients of materials placed in one arm of the interferometer for wavelengths from 0.4-1.1 /spl mu/m.
  • Keywords
    Michelson interferometers; high-speed optical techniques; laser beams; light interferometry; nonlinear optics; optical dispersion; optical materials; barium borate; dielectrics; dispersion coefficients; dispersion measurements; extended wavelength range; femtosecond laser pulses; femtosecond pulse propagation; nonlinear materials; optical materials; white light Michelson interferometer; white light interferometry; Bandwidth; Dielectric materials; Dielectric measurements; Dispersion; Optical interferometry; Optical materials; Optical propagation; Optical pulses; Ultrafast optics; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-339-0
  • Type

    conf

  • DOI
    10.1109/CLEO.1998.676068
  • Filename
    676068