Title :
The new matrix characteristic methods of image fine registration for synthetic aperture radar interferometry
Author :
Debao, Ma ; Wugao, Li ; Zhongxin, Le ; Jiefeng, Wang
Author_Institution :
Electron. Technol. Res. Inst., Zheng Zhou, China
Abstract :
The image registration is the first step for synthetic aperture radar (SAR) interferometry (INSAR), which is performed in two steps: coarse and fine registration. The least square method and polynomial method in several elements are the traditional fine registration methods. The authors introduce the new matrix characteristic (MC), methods: characteristic polynomial, eigenvalues, eigenvectors and vector fitting polynomial methods, for MC can indicate the surface integration characteristic of first class sub-images. The achievable accuracy is derived theoretically and verified by tests using the simulated interferometric data. The registration accuracy is more precise than that of other methods
Keywords :
geophysical techniques; image registration; matrix algebra; radar imaging; radar theory; remote sensing by radar; synthetic aperture radar; terrain mapping; InSAR; SAR; characteristic polynomial; eigenvalue; eigenvector; geophysical measurement technique; image fine registration; image registration; interferometric SAR; land surface; matrix characteristic method; new matrix characteristic; radar imaging; radar remote sensing; synthetic aperture radar; synthetic aperture radar interferometry; terrain mapping; vector fitting polynomial method; Eigenvalues and eigenfunctions; Image registration; Image sensors; Least squares approximation; Least squares methods; Polynomials; Spaceborne radar; Synthetic aperture radar; Synthetic aperture radar interferometry; Testing;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.861694