DocumentCode :
3534607
Title :
Damage analysis of 2008 Wenchuan earthquake using SAR images
Author :
Jiang, Kai ; Wang, Chao ; Zhang, Hong ; Chen, Wei ; Zhang, Bo ; Tang, Yixian ; Wu, Fan
Author_Institution :
East China Res. Inst. of Electron. Eng., Hefei, China
Volume :
5
fYear :
2009
fDate :
12-17 July 2009
Abstract :
On May 12, 2008, Wenchuan earthquake (Ms 8.0) occurred in Sichuan, Southwestern China. This catastrophe caused severe damage of constructions in urban and rural areas, and fundamental infrastructure, such as those facilities of factories, electrical power, telecommunication and transportation, etc. The earthquake also resulted in many geological phenomena, i.e. landslide, debris flow, landslide lakes, etc. which also triggered off damage and threat. The airborne campaigns were performed after the earthquake with high-resolution SAR system for rescue and relief effort and damage assessment. In this study, damage of various facilities was described and analyzed using airborne SAR images acquired during the campaigns. The results were verified with ground truth investigation. The results showed the role of SAR data in earthquake damage assessment.
Keywords :
disasters; earthquakes; remote sensing by radar; synthetic aperture radar; AD 2008 05 12; SAR images; Sichuan; Wenchuan earthquake; debris flow; earthquake damage analysis; earthquake damage assessment; geological phenomena; ground truth investigation; high resolution SAR system; landslide lakes; rescue and relief efforts; rural area damage; southwestern China; synthetic aperture radar; urban area damage; Aerospace electronics; Cities and towns; Data engineering; Earth; Earthquake engineering; Geoscience; Image analysis; Lakes; Synthetic aperture radar; Terrain factors; High resolution; SAR; airborne; field validation; interpretation; multi-band;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
Conference_Location :
Cape Town
Print_ISBN :
978-1-4244-3394-0
Electronic_ISBN :
978-1-4244-3395-7
Type :
conf
DOI :
10.1109/IGARSS.2009.5417722
Filename :
5417722
Link To Document :
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