Title :
An improved nearest neighbor method for the estimation of the gamma photon entry point in monolithic scintillator detectors for PET
Author :
Beekman, Freek J. ; Schaart, Dennis R. ; Van Dam, Herman T. ; Seifert, Stefan ; Vinke, Ruud ; Dendooven, Peter ; Löhner, Herbert
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Several improvements of the k-nearest neighbor (k-NN) method for the determination of the entry point (x, y) of a gamma photon in a monolithic scintillator PET detector have been investigated with the aim to obtain better spatial resolution and/or to enable faster detector calibration by reducing the amount of required reference data and by allowing for calibrating with a line source. These methods were tested on a dataset measured with a SiPM-array-based monolithic LYSO detector. It appears that ~10% to ~25% better spatial resolution can be obtained compared to the standard approach. Moreover, some of the improved methods using two orders of magnitude less reference data, yield essentially the same spatial resolution as the standard method, which reduces the time needed for calibration as well as entry point computation. Finally, line source calibration is shown to be possible with some of the methods, yielding better results than the standard method and allowing much faster and easier collection of the reference data.
Keywords :
calibration; elemental semiconductors; estimation theory; image resolution; lutetium compounds; medical image processing; photomultipliers; positron emission tomography; silicon; solid scintillation detectors; yttrium compounds; (LuY)2SiO5; PET; Si; SiPM array; faster detector calibration; gamma photon entry point estimation; k-nearest neighbor; line source calibration; monolithic scintillator detectors; nearest neighbor method; spatial resolution; Calibration; Detectors; Histograms; Nearest neighbor searches; Photonics; Radiation effects; Spatial resolution;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874368