DocumentCode :
353468
Title :
DEM generation using ERS-1/2 interferometric SAR data
Author :
Shiping, Shi
Author_Institution :
Xian Res. Inst. of Surveying & Mapping, China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
788
Abstract :
Accurate digital elevation model (DEM) can be producted by using interferometric SAR data. The authors have developed a new software on PCs that can automatically generate DEM from single look complex SAR pairs. The least-squares image matching method based on SAR multi-look intensity images has been used to register complex image pair. The typical accuracy of 0.02-0.04 pixel size can be obtained on multi-look SAR images. They also present a new set of equations for calculating three dimensional coordinates at each pixel from unwrapped phases. The orbital position, attitude and baseline as well as phase constant have been involved in the equations. Using at least six ground control points, it is possible to refine interferometric baseline, and estimate the phase constant, the orbit and attitude parameters simultaneously. Test results are provided for ERS-1/2 interferometric SAR scene pair acquired over Etna area in Italy
Keywords :
geodesy; geophysical techniques; geophysics computing; remote sensing by radar; spaceborne radar; synthetic aperture radar; terrain mapping; topography (Earth); DEM generation; ERS; InSAR; complex image pair; digital elevation model; geodesy; geophysical measurement technique; geophysics computing; interferometric SAR; interferometric baseline; land surface topography; least-squares image matching; multi-look intensity image; phase constant; radar remote sensing; single look complex SAR pair; software; spaceborne radar; synthetic aperture radar; terrain mapping; Attitude control; Digital elevation models; Equations; Image matching; Layout; Orbital calculations; Personal communication networks; Phase estimation; Pixel; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
Type :
conf
DOI :
10.1109/IGARSS.2000.861704
Filename :
861704
Link To Document :
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