• DocumentCode
    3534853
  • Title

    Current driven domain wall study in U-shape permalloy wire

  • Author

    Tsai, J.L. ; Lin, K.W. ; Yao, Y.D. ; Lee, S.F. ; Liou, Y.

  • Author_Institution
    Inst. of Phys., Acad. Sinica, Taipei, Taiwan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1009
  • Lastpage
    1010
  • Abstract
    Current-induced domain wall study in a single layer ferromagnetic U-shape structure is reported. The U-shape Ni80Fe20 permalloy wire, 40 nm thick, 0.5 μm wide and 6 μm long is fabricated by means of electron-beam lithography and lift-off techniques. A maximum magnetic field of 4 kOe is applied and detailed investigations are performed from - to 400 Oe. Results from four-channel dc system measurements reveal the resistance jumps at a critical positive DC current of 1.75 mA in which this jump is found to be irreversible. There is no symmetric jump when a negative DC current is applied. This implies that there is an asymmetric domain wall depinning due to the inclined free energy landscape. The jump of resistance corresponds to the domain wall motion in MFM images. Therefore, high current density replaces the applied field and induces the domain wall motion.
  • Keywords
    current density; electrical resistivity; electron beam lithography; ferromagnetic materials; free energy; iron alloys; magnetic domain walls; magnetic force microscopy; nickel alloys; 0.5 mum; 1.75 mA; 40 nm; 6 mum; MFM images; Ni80Fe20; asymmetric domain wall depinning; critical positive DC current; current-induced domain wall; domain wall motion; electron-beam lithography; four-channel dc system measurements; high current density; inclined free energy landscape; lift-off techniques; negative DC current; permalloy wire; resistance; single layer ferromagnetic U-shape structure; symmetric jump; Current density; Current measurement; Electrical resistance measurement; Iron; Lithography; Magnetic domain walls; Magnetic field measurement; Magnetic force microscopy; Performance evaluation; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1463933
  • Filename
    1463933