• DocumentCode
    3534868
  • Title

    Domain wall magnetoresistance in permalloy half-ring wires

  • Author

    Yu, C. ; Lee, S.P. ; Huang, E.W. ; Cheng, K.W. ; Chen, D.C. ; Liou, Y. ; Yao, Y.D. ; Chang, C.R.

  • Author_Institution
    Inst. of Phys., Acad. Sinica, Taipei, Taiwan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1011
  • Lastpage
    1012
  • Abstract
    Submicron permalloy wires with half-ring and s-shape structure are designed. Magnetoresistance loops are measured between the sweeping field ±4000 Oe at varying angles between external field and longitudinal axis. The resistances in remanent state of s-shape wire are found to be almost same value for every angle. On the other hand, the resistances of half-ring wire are found to be decreasing with increasing angle. Magnetic force microscopy images of the wires confirm the varied resistances result from different domain structures on the corners with domain wall or without domain wall. The domain wall resistance (DWR) in half-ring wires is estimated to be about 0.31%. Theoretical calculations based on impurity scattering model and spin accumulation model are done to validate the experimental data. DWR from spin accumulation model is 0.012%∼0.031% and from impurity scattering model, it is 0.15%∼0.33%.
  • Keywords
    Permalloy; ferromagnetic materials; impurity scattering; magnetic domain walls; magnetic force microscopy; magnetoresistance; nanowires; remanence; NiFe; domain wall magnetoresistance; half-ring wire; impurity scattering model; magnetic force microscopy; remanent state; s-shape wire; spin accumulation model; submicron permalloy wires; sweeping field; Electrical resistance measurement; Impurities; Magnetic domain walls; Magnetic domains; Magnetic force microscopy; Magnetoresistance; Physics; Saturation magnetization; Scattering; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1463934
  • Filename
    1463934