• DocumentCode
    3534957
  • Title

    An effective algorithm for simultaneously mining frequent patterns and association rules

  • Author

    Wei, Wei ; Yu, Songnian ; Guo, Qiang ; Ding, Wang ; Bian, Liya

  • Author_Institution
    Sch. of Comput. Eng. & Sci., Shanghai Univ., Shanghai
  • Volume
    1
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    190
  • Lastpage
    195
  • Abstract
    Within the area of association rules mining, previous algorithms, e.g., FP-Growth and Apriori, have been generally accepted with high appraisals respectively. Most of these algorithms decompose the problem of mining association rules into two subproblems: find frequent pattern and generate the desired rules. Therefore, such a decomposition strategy cannot but bring delay problem when the size of database is considerable and makes user unbearable in a system where the required feedback time is rigor. To solve the problem, we catch a deep insight of FP-Growth algorithm and propose an effective algorithm by utilizing the FP-tree, called AR-Growth (Association Rule Growth), which can simultaneously discover frequent itemsets and association rules (AR) in a large database. It is analyzed in theory that our algorithm is correct and association rules generated by the algorithm are complete. The experiments show that the output of the AR sequence generated by AR-Growth is closely linear with the elapsed runtime, instead of the sudden eruption in FP-Growth.
  • Keywords
    data mining; tree data structures; very large databases; FP-growth algorithm; association rule growth FP-tree; association rule mining algorithm; frequent pattern mining; large database; simultaneous frequent itemset discovery; Algorithm design and analysis; Appraisal; Association rules; Data analysis; Data mining; Databases; Delay effects; Feedback; Itemsets; Runtime; AR-Growth; Association Rules; FP-tree; Linear Generate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service Operations and Logistics, and Informatics, 2008. IEEE/SOLI 2008. IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-2012-4
  • Electronic_ISBN
    978-1-4244-2013-1
  • Type

    conf

  • DOI
    10.1109/SOLI.2008.4686389
  • Filename
    4686389