• DocumentCode
    3535132
  • Title

    Intrinsic oscillations in resonant tunneling structures

  • Author

    Woolard, D.L. ; Brown, E.R. ; Buot, F.A. ; Lu, X.J. ; Rhodes, David L. ; Perlman, B.S.

  • Author_Institution
    US Army Res. Lab., Fort Monmouth, NJ, USA
  • fYear
    1995
  • fDate
    19-21 June 1995
  • Firstpage
    54
  • Lastpage
    55
  • Abstract
    The resonant tunneling diode (RTD) is an important device because it yields a negative differential resistance which can respond very rapidly to changes in applied bias. In fact, RTDs have been shown experimentally to have detection capabilities up to 2.5 THz and have been implemented as oscillators up to 712 GHz. However, RTD-based power sources have only demonstrated microwatt levels (i.e. <50 /spl mu/W) of performance above 100 GHz. Traditional RTD-based sources generate power by establishing limit-cycles which exchange energy with storage elements in the external circuit. Hence, in this implementation the amount of achievable output power will always be limited by external losses (e.g. contact resistance) and low-frequency design constraints (i.e. suppression of bias circuit oscillations). Recently, we have performed a comprehensive study of various nonlinear second-order circuit forms in an effort to reproduce the high-frequency self-oscillations observed in previous quantum-transport simulations of an RTD structure. A comparison between these two theoretical results allows one to deduce intrinsic oscillations which are free of external resonances.
  • Keywords
    contact resistance; losses; millimetre wave diodes; resonant tunnelling diodes; submillimetre wave diodes; RTD-based power sources; achievable output power; bias circuit oscillations; contact resistance; detection capabilities; external losses; high-frequency self-oscillations; intrinsic oscillations; limit-cycles; low-frequency design constraints; negative differential resistance; nonlinear second-order circuit forms; resonant tunneling diode; storage elements; Resonant tunneling devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 1995. Digest. 1995 53rd Annual
  • Conference_Location
    Charlottesville, VA, USA
  • Print_ISBN
    0-7803-2788-8
  • Type

    conf

  • DOI
    10.1109/DRC.1995.496268
  • Filename
    496268