Carbon supported In-Sn oxide films

Author

Rout, D. ; Viswanath, R.N. ; Dash, S. ; Tyagi, A.K.

Author_Institution

Surface & Nanosci. Div., Indira Gandhi Centre for Atomic Res., Kalpakkam, India

fYear

2011

fDate

28-30 Nov. 2011

Firstpage

508

Lastpage

510

Abstract

Sol-gel derived indium-tin oxide (ITO) films, spin coated on to pulsed dc magnetron sputtered carbon layers, were studied using the techniques like atomic force microscopy (AFM), glancing incidence X-ray diffractometry (GIXRD), photoluminescence (PL), and electrical resistivity. The effect of carbon substrate on the physical properties (structural, luminescence and conductivity) of the deposited films was examined. The radiant relaxation energy obtained from PL studies and the electron band gap energy Eg computed from the conductivity versus temperature plot are compared.

Keywords

X-ray diffraction; atomic force microscopy; carbon; electrical conductivity; electrical resistivity; energy gap; indium compounds; photoluminescence; sol-gel processing; spin coating; sputter deposition; thin films; C-ITO; atomic force microscopy; carbon substrate; carbon supported oxide film; electrical conductivity; electrical resistivity; electron band gap energy; glancing incidence X-ray diffractometry; luminescence; photoluminescence; pulsed dc magnetron sputtered carbon layer; radiant relaxation energy; sol-gel derived indium-tin oxide film; spin coating; Carbon; Electric variables measurement; Films; Heating; Indium; Optical imaging; X-ray scattering; Carbon supported ITO films; ITO thin films; conductivity; interface structure; photoluminescence studies;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanoscience, Engineering and Technology (ICONSET), 2011 International Conference on

Conference_Location

Chennai

Print_ISBN

978-1-4673-0071-1

Type

conf

DOI

10.1109/ICONSET.2011.6168017

Filename

6168017