DocumentCode
3535720
Title
Multilevel Transmission Line Pulse (MTLP) tester
Author
Daenen, T. ; Thijs, S. ; Natarajan, M.I. ; Vassilev, V. ; De Heyn, V. ; Groeseneken, G.
Author_Institution
IMEC, Leuven, Belgium
fYear
2004
fDate
19-23 Sept. 2004
Firstpage
1
Lastpage
6
Abstract
A novel TLP testing approach, multilevel TLP (MTLP), is described, which can yield accurate and comprehensive snapback IV measurements unlike in the conventional TLP testing methodology with different system impedances. The experimental validity of the MTLP methodology and setup are demonstrated with measurement results from different snapback devices.
Keywords
electrostatic discharge; integrated circuit testing; integrated circuit yield; transmission lines; ESD; multilevel TLP testing; multilevel transmission line pulse tester; snapback IV measurements; Attenuation measurement; Circuit testing; Electrostatic discharge; Impedance measurement; Protection; Pulse measurements; Shape measurement; System testing; Transmission lines; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location
Grapevine, TX
Print_ISBN
978-1-5853-7063-4
Electronic_ISBN
978-1-5853-7063-4
Type
conf
DOI
10.1109/EOSESD.2004.5272592
Filename
5272592
Link To Document