Title :
Multilevel Transmission Line Pulse (MTLP) tester
Author :
Daenen, T. ; Thijs, S. ; Natarajan, M.I. ; Vassilev, V. ; De Heyn, V. ; Groeseneken, G.
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
A novel TLP testing approach, multilevel TLP (MTLP), is described, which can yield accurate and comprehensive snapback IV measurements unlike in the conventional TLP testing methodology with different system impedances. The experimental validity of the MTLP methodology and setup are demonstrated with measurement results from different snapback devices.
Keywords :
electrostatic discharge; integrated circuit testing; integrated circuit yield; transmission lines; ESD; multilevel TLP testing; multilevel transmission line pulse tester; snapback IV measurements; Attenuation measurement; Circuit testing; Electrostatic discharge; Impedance measurement; Protection; Pulse measurements; Shape measurement; System testing; Transmission lines; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272592
