• DocumentCode
    3535738
  • Title

    Development strategy for TLU-robust products

  • Author

    Domanski, K. ; Bargstadt-Franke, S. ; Stadler, W. ; Glaser, U. ; Bala, W.

  • Author_Institution
    CL DAT LIB IO, Infineon Technol. AG, Munich, Germany
  • fYear
    2004
  • fDate
    19-23 Sept. 2004
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Detailed transient latch-up (TLU) analyses of external test structures show that a DC trigger does not necessarily reflect worst case conditions. Furthermore, the classical guard ring latch-up protection approach fails for transient trigger. In this contribution, design recommendations for TLU-safe designs are presented. The knowledge about the perturbation environment and an appropriate design are essential for a TLU-robust product.
  • Keywords
    flip-flops; logic testing; DC trigger; guard ring latch-up protection; transient latch-up analyses; Area measurement; Capacitance; Detectors; Power measurement; Power supplies; Protection; Qualifications; Robustness; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
  • Conference_Location
    Grapevine, TX
  • Print_ISBN
    978-1-5853-7063-4
  • Electronic_ISBN
    978-1-5853-7063-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.2004.5272595
  • Filename
    5272595
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3535738