Title :
Development strategy for TLU-robust products
Author :
Domanski, K. ; Bargstadt-Franke, S. ; Stadler, W. ; Glaser, U. ; Bala, W.
Author_Institution :
CL DAT LIB IO, Infineon Technol. AG, Munich, Germany
Abstract :
Detailed transient latch-up (TLU) analyses of external test structures show that a DC trigger does not necessarily reflect worst case conditions. Furthermore, the classical guard ring latch-up protection approach fails for transient trigger. In this contribution, design recommendations for TLU-safe designs are presented. The knowledge about the perturbation environment and an appropriate design are essential for a TLU-robust product.
Keywords :
flip-flops; logic testing; DC trigger; guard ring latch-up protection; transient latch-up analyses; Area measurement; Capacitance; Detectors; Power measurement; Power supplies; Protection; Qualifications; Robustness; Testing; Transient analysis;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272595