Title :
Study of “hot spots” arising from non-homogeneity in the micro-structures of dissipative materials
Author :
Yap, Ber-Chin ; Newberg, Carl
Author_Institution :
Nanotronix Technol., Gelugor, Malaysia
Abstract :
DC resistance testing using standard commercial electrodes has been a simple, standard way adopted by many for their evaluation of dissipative materials. However, we have observed that this test is ineffective for the detection of ldquohot spotsrdquo arising from non-homogeneities in the micro-structures of some dissipative materials. We have employed a combination of tests using a direct sharp tip probe for both resistance and charge decay measurements and a small non-contact electrostatic voltmeter for localized surface voltage measurements. These combined tests furnish better information about ldquohot spotrdquo characteristics and their formation in dissipative materials. We wish to share the test techniques, the results and the analysis of our present study.
Keywords :
absorbing media; crystal microstructure; electrical resistivity; voltmeters; DC resistance testing; charge decay measurements; dissipative materials; hot spot; localised surface voltage measurements; microstructure; noncontact electrostatic voltmeter; tip probe; Charge measurement; Current measurement; Electrical resistance measurement; Electrodes; Electrostatic measurements; Materials testing; Probes; Surface resistance; Voltage measurement; Voltmeters;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272607