• DocumentCode
    3535915
  • Title

    Performance of capacitor dielectrics during some of the important tests of IEC standards

  • Author

    Nagamani, H.N. ; Shanker, T. Bhavani ; Vaidhyanathan, V. ; Neelakantan, S. ; GovindaRao, G.

  • Author_Institution
    Central Power Res. Inst. Bangalore, Bangalore, India
  • fYear
    2012
  • fDate
    24-28 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Reliability of power capacitor plays a key role in effective reactive power management in power system. Performance evaluation, following certain standard procedures, is an important stage in assessing the reliability of power capacitors as it helps to identify the deficiencies prior to their application in electrical network. Performance of capacitor dielectrics is generally assessed with reference to testing standards like Indian Standard, IEC standard, IEEE standard, etc. The paper deals with the performance of capacitor dielectrics namely, oil impregnated-polypropylene film and metalized polypropylene film, during some of the critical tests like electrical endurance test, discharge current test, thermal stability test, ageing test and destruction test covered in IEC standard.
  • Keywords
    IEC standards; electron device testing; power capacitors; reliability; IEC standards; IEEE standard; Indian Standard; ageing test; capacitor dielectrics; destruction test; discharge current test; electrical endurance test; metalized polypropylene film; oil impregnated-polypropylene film; power capacitor reliability; power system; reactive power management; testing standards; thermal stability test; Capacitors; Current measurement; Discharges (electric); Partial discharges; Shunts (electrical); Standards; Thermal stability; Capacitor dielectrics; IEC standard; ageing; destruction test; discharge current; electrical endurance; over pressure; over voltage; testing; thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials (ICPADM), 2012 IEEE 10th International Conference on the
  • Conference_Location
    Bangalore
  • ISSN
    2160-9225
  • Print_ISBN
    978-1-4673-2852-4
  • Type

    conf

  • DOI
    10.1109/ICPADM.2012.6318982
  • Filename
    6318982