Title :
Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps
Author :
Ashton, R.A. ; Weir, B.E. ; Weiss, G. ; Meuse, T.
Author_Institution :
White Mountain Labs., Phoenix, AZ, USA
Abstract :
HBM and TLP measurements on dynamically triggered CMOS power supply clamps were found to be inconsistent for low leakage clamps. The failures at low HBM voltage were found to be due to a voltage ramp leading up to the HBM pulse which prevented the clamps from turning on.
Keywords :
CMOS integrated circuits; clamps; integrated circuit measurement; integrated circuit testing; power integrated circuits; power supply circuits; HBM measurements; HBM stress; TLP measurements; dynamically triggered CMOS power supply clamps; human body model testing; low leakage clamps; transmission line pulse testing; Circuit testing; Clamps; Electrostatic discharge; MOS devices; Power supplies; Protection; Pulsed power supplies; Stress; Variable structure systems; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272616
