DocumentCode
3535973
Title
ESD protection design using a mixed-mode simulation for advanced devices
Author
Hayashi, Hirokazu ; Kuroda, Toshikazu ; Kato, Katsuhiro ; Fukuda, Koichi ; Baba, Shunsuke ; Fukuda, Yasuhiro
Author_Institution
Oki Electr. Ind. Co. Ltd., Hachioji, Japan
fYear
2004
fDate
19-23 Sept. 2004
Firstpage
1
Lastpage
7
Abstract
In this paper, we propose a new ESD protection design methodology using a mixed-mode ESD simulation that takes account of a coupling effect for both device and circuit. As a result, we can analysis the each protection unit operation and select the optimized protection circuits in prevention of ESD failure on separated power supply units by prediction of the simulation.
Keywords
electrostatic discharge; mixed analogue-digital integrated circuits; ESD protection design; advanced devices; mixed-mode simulation; power supply units; Breakdown voltage; Circuit simulation; Coupling circuits; Design methodology; Electrostatic discharge; Large scale integration; MOSFET circuits; Power supplies; Power system protection; Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location
Grapevine, TX
Print_ISBN
978-1-5853-7063-4
Electronic_ISBN
978-1-5853-7063-4
Type
conf
DOI
10.1109/EOSESD.2004.5272620
Filename
5272620
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