Title :
Fast GATE multi-pinhole SPECT simulations
Author :
De Beenhouwer, Jan ; Staelens, Steven
Author_Institution :
Med. Image & Signal Process. Group, Ghent Univ., Ghent, Belgium
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Multi-pinhole collimation is increasingly being used in SPECT imaging. A wide variety of geometric designs has recently been introduced, which can easily be modeled with the Monte Carlo simulator GATE. However multi-pinhole simulations are still very inefficient with GATE due to the lack of a dedicated variance reduction technique. In this work, we introduced a pinhole forced detection method which allows for fast 99mTc GATE multi-pinhole simulations. An excellent agreement with analog GATE simulations was found in terms of spatial resolution, energy spectra, sensitivity and collimator penetration. As the collimator-detector response is modeled with full Monte Carlo - without making any assumptions on the detector configuration - our method can be of use in multi-pinhole collimator design, development of compensation methods and image reconstruction.
Keywords :
Monte Carlo methods; collimators; image reconstruction; image resolution; medical image processing; medical signal detection; single photon emission computed tomography; Monte Carlo simulator; collimator penetration; compensation methods; fast 99mTc GATE multipinhole SPECT simulations; image reconstruction; pinhole forced detection method; spatial resolution; Apertures; Collimators; Detectors; Logic gates; Monte Carlo methods; Phantoms; Photonics;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874489