Investigations of the high flux behavior of CdTe-Medipix2 assemblies at the synchrotron ANKA

Author

Greiffenberg, D. ; Cecilia, A. ; Zwerger, A. ; Fauler, A. ; Vagovic, P. ; Butzer, J. ; Hamann, E. ; Rolo, T. Dos Santos ; Baumbach, T. ; Fiederle, M.

Author_Institution

Freiburger Materialforschungszentrum (FMF), Univ. of Freiburg, Freiburg, Germany

fYear

2010

fDate

Oct. 30 2010-Nov. 6 2010

Firstpage

3689

Lastpage

3693

Abstract

CdTe is a promising sensor material for the detection of γ-Rays and X-Rays as it offers an absorption efficiency higher than 50 % for photon energies up to 120 keV for 1 mm thick sensors. Connected to the pixilated, single-photon counting readout electronics Timepix, its application at a synchrotron source was investigated. The focus of the investigations was on the high flux behavior of the CdTe-Timepix assemblies, as CdTe is known to suffer from a degradation of the count-rates when being illuminated with high photon fluxes. Moreover, the high flux behavior of the readout electronics itself was investigated by measuring an assembly with a silicon sensor, which is not known to suffer from a degradation effect at high photon fluxes.

Keywords

II-VI semiconductors; X-ray apparatus; X-ray effects; cadmium compounds; gamma-ray apparatus; gamma-ray effects; nuclear electronics; readout electronics; semiconductor counters; synchrotron radiation; ANKA synchrotron; CdTe; CdTe sensor material; CdTe-Medipix2 assemblies; CdTe-Timepix assemblies; X-ray detection; count rate degradation; gamma-ray detection; high flux behavior; pixilated single photon counting readout electronics; synchrotron source; Assembly; Degradation; Lighting; Materials; Photonics; Pixel; Synchrotrons;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE

Conference_Location

Knoxville, TN

ISSN

1095-7863

Print_ISBN

978-1-4244-9106-3

Type

conf

DOI

10.1109/NSSMIC.2010.5874501

Filename

5874501