• DocumentCode
    3536164
  • Title

    1/f noise in spin transistors

  • Author

    Hwang, Y.T. ; Lin, M.C. ; Huang, Y.W. ; Lo, C.K. ; Yao, Y.D. ; Huang, H.L.

  • Author_Institution
    Opto-Electron. & Syst. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1213
  • Lastpage
    1214
  • Abstract
    The model of 1/f noise for a spin transistor have been studied. The sources of the 1/f noise have been differentiated into two. One source is from the PN junction with the major contributor of recombination, and the other from the giant magnetoresistance multilayer. Actual data was measured on a spin transistor while doing a simulation of the 1/f noise. The measured data matches the output of the simulations.
  • Keywords
    1/f noise; giant magnetoresistance; magnetic multilayers; p-n junctions; thin film transistors; 1/f noise; PN junction; giant magnetoresistance; multilayer; spin transistors; Circuit noise; Computational modeling; Equivalent circuits; Fabrication; Frequency measurement; Knee; Noise measurement; Nonhomogeneous media; Thin film circuits; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464036
  • Filename
    1464036