DocumentCode
3536228
Title
The investigation of the ionic component of conductivity in TlBr
Author
Gazizov, I.M. ; Kuznetsov, M.V. ; Lisitsky, I.S. ; Zaletin, V.M.
Author_Institution
JSC Inst. in Phys.-Tech. Problems, Dubna, Russia
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
3732
Lastpage
3738
Abstract
The dark conductivity has been studied on pure and doped TlBr crystals obtained by Bridgement method with different compositions and pressures of the residual vapors over the melt. The specific resistance of the pure crystals at room temperature was (0.7-2) · 1010 Ω·cm and that of doped crystals depended on the amount of the incorporated Pb impurity and was equal to 1.8·1011 Ω·cm. The conductivity activation energy near room temperature was equal to 0.8-0.85 eV and 0.6-1.2 eV for the pure and doped crystals, respectively. The conductivity activation energy of the studied crystals is in agreements with the known values of the energies of formation and dislocation of Schottky defects in TlBr at high temperatures. The expression for the dependence of the crystal specific resistance on their content of Pb bivalent cations has been found. The equilibrium concentration of Schottky point defects in the studied TlBr pure crystals has been calculated and it was equal to 6.4·1014 cm-3. The displacement mobilities of anionic and cationic vacancies were μa = 9.8 ×10-7 cm2 V-1 c-1 and μc =3.4×10-10 cm2 V-1 c-1, respectively. The studies have been carried out within the frame of the ISTC project # 2728.
Keywords
Schottky defects; crystal growth from melt; dark conductivity; electric resistance; ionic conductivity; lead; semiconductor counters; semiconductor doping; semiconductor growth; thallium compounds; wide band gap semiconductors; Bridgement method; Schottky defect dislocation; Schottky defect formation; Schottky point defect equilibrium concentration; TlBr; TlBr ionic conductivity component; TlBr:Pb; anionic vacancy displacement mobility; cationic vacancy displacement mobility; conductivity activation energy; crystal specific resistance; dark conductivity; doped TlBr crystals; electron volt energy 0.6 eV to 1.2 eV; electron volt energy 0.8 eV to 0.85 eV; lead content; lead impurity; pure TlBr crystals; residual vapor composition; residual vapor pressure; room temperature electrical resistance; Conductivity; Crystals; Dark current; Gold; Impurities; Lead; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874509
Filename
5874509
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