DocumentCode :
3536345
Title :
Fabrication and characteristics of sub-micrometer vertical type organic semiconductor copper phthalocyanine thin film transistor
Author :
Wang, Dongxing ; Wang, Xiaolin ; Wang, Changhao ; Pang, Chao ; Yin, Jing Hua ; Zhao, Hong
Author_Institution :
Dept. of Electron. Sci. & Technol., Harbin Univ. of Sci. & Technol., Harbin, China
fYear :
2012
fDate :
24-28 July 2012
Firstpage :
1
Lastpage :
4
Abstract :
The sub-micrometer vertical type current channel of semi-conductive Al gate organic semiconductor copper phthalocyanine thin film transistor (VOTFT) with five layered structure of Au (Drain)/CuPc/Al(Gate)/CuPc/Au (Source) is fabricated by vacuum evaporation technique with organic semiconductor copper phthalocyanine (CuPc). As the thickness of semi-conductive Al thin film is approximately 20nm, the carriers emitted from source electrode tunnel through CuPc/Al/CuPc double schottky barrier and formed the operating current of thin film transistors. The result shows that VOTFT have the characteristics of the unsaturated voltage and current similar with the bipolar mode static induction transistor, strong gate voltage capacity and high current density, operating current density can be achieved to 0.0972A/cm-2. The dynamic small signal responsive frequency can be achieved to ~1000Hz.
Keywords :
Schottky barriers; aluminium; copper compounds; current density; electrodes; gold; organic field effect transistors; thin film transistors; vacuum deposition; Al; Au; VOTFT; bipolar mode static induction transistor; double Schottky barrier; dynamic small signal responsive frequency; gate voltage capacity; high current density; organic semiconductor copper phthalocyanine thin film transistor; source electrode tunnel; submicrometer vertical type current channel; submicrometer vertical type thin film transistor fabrication; vacuum evaporation technique; Resists; Switches; Transistors; copper phthalocyanine; organic semiconductor; thin film transistor; vacuum evaporate;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials (ICPADM), 2012 IEEE 10th International Conference on the
Conference_Location :
Bangalore
ISSN :
2160-9225
Print_ISBN :
978-1-4673-2852-4
Type :
conf
DOI :
10.1109/ICPADM.2012.6319021
Filename :
6319021
Link To Document :
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