Title :
Correlative-impulse measuring instrument of low frequency noise sources of semiconductor devises
Author_Institution :
St.-Petersburg State Polytech. Univ., St.-Petersburg, Russia
Abstract :
The skeleton diagram of correlative-impulse measuring instrument of LF noise sources of semiconductor devises is shown. The principle of action of a measuring instrument for a case of measurements of diodes with Schottky barrier is considered. The reasons of inaccuracy of measurements are specified. The assessment of accuracy of correlation coefficient is given.
Keywords :
Schottky barriers; Schottky diodes; impulse noise; noise measurement; semiconductor device measurement; semiconductor device noise; LF noise sources; correlation coefficient accuracy assessment; correlative-impulse measuring instrument; diode measurements; low frequency noise sources; semiconductor devices; skeleton diagram; Frequency measurement; Noise; Noise measurement; Semiconductor device measurement;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4673-2096-2
DOI :
10.1109/APEDE.2012.6478007
