Title :
Dynamic temperature rise of shielded MR sensors during simulated electrostatic discharge pulses of variable pulse width
Author :
Eric, Igor ; Iben, T.
Author_Institution :
IBM Co., San Jose, CA, USA
Abstract :
The temperature rise from Electrostatic discharge (ESD) of shielded AMR sensors used for magnetic tape storage devices is studied using square wave voltage pulses with widths from 35 ns to 2 ms. A phenomenological model has been developed to describe the dynamic stripe temperature versus pulse width and power for the time range studied as well as for a wide range in sensor geometries. The temperature required to melt the stripes was determined to be 1437 plusmn 69degC. The activation energy required to achieve a 2% increase in stripe resistance for pulses between 100 ns and 1 ms was determined to be 2.8 eV and is associated with interdiffusion of the stripe metals.
Keywords :
electrostatic discharge; magnetic heads; magnetic sensors; magnetic tape storage; thermal conductivity; activation energy; dynamic temperature rise; electrostatic discharge; interdiffusion; magnetic tape storage devices; shielded MR sensors; shielded magnetoresistive sensors; simulated electrostatic discharge pulses; square wave voltage pulses; stripe metals; stripe resistance; variable pulse width; Electrostatic discharge; Magnetic devices; Magnetic sensors; Magnetic shielding; Sensor phenomena and characterization; Solid modeling; Space vector pulse width modulation; Temperature distribution; Temperature sensors; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272812