• DocumentCode
    3536596
  • Title

    High remanence, epitaxial SmCo5 thin films

  • Author

    Singh, A. ; Neu, V. ; Tamm, R. ; Fähler, S. ; Skrotzki, W. ; Schultz, L. ; Holzapfel, B.

  • Author_Institution
    IFW Dresden, Germany
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1289
  • Lastpage
    1290
  • Abstract
    The epitaxial growth of the SmCo5 phase and the possibility for obtaining a homogenous film with improved magnetic properties compared to the epitaxial Sm2Co7 films were explored. Pulsed laser deposition (Kr-F excimer laser) from elemental targets was used to obtain these films on single crystal MgO(100) substrates with Cr buffers. Film thickness and compositions were determined by voltage-dependent X-ray chemical analysis measurements and first information about the phase formation is derived from X-ray diffraction. Pole figure measurements using CaRIne crystallography reveal four discreet and sharp poles, which indicate complete crystallization in the film. Results also confirm phase purity, and a very strong magnetic in-plane texture and high coercivity.
  • Keywords
    X-ray chemical analysis; X-ray diffraction; cobalt alloys; coercive force; crystallisation; epitaxial growth; magnetic epitaxial layers; metallic epitaxial layers; pulsed laser deposition; remanence; samarium alloys; surface composition; texture; CaRIne crystallography; Kr-F excimer laser; MgO; SmCo5; X-ray diffraction; coercivity; crystallization; epitaxial growth; epitaxial thin films; film compositions; film thickness; homogenous film; magnetic in-plane texture; magnetic properties; phase purity; pole figure measurements; pulsed laser deposition; remanence; voltage-dependent X-ray chemical analysis measurements; Chemical elements; Chemical lasers; Crystallization; Epitaxial growth; Magnetic films; Magnetic properties; Optical pulses; Pulsed laser deposition; Remanence; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464074
  • Filename
    1464074