DocumentCode
3536605
Title
Experimental evaluation of material identification methods with CdTe X-rays spectrometric detector
Author
Rinkel, Jean ; Beldjoudi, Guillaume ; Gonon, Georges ; Brambilla, Andrea ; Rebuffel, Véronique ; Boudou, Caroline ; Ouvrier-Buffet, Patrice ; Verger, Loïck
Author_Institution
Rech. Technol., CEA-LETI-MINATEC, Grenoble, France
fYear
2010
fDate
Oct. 30 2010-Nov. 6 2010
Firstpage
3901
Lastpage
3906
Abstract
This paper presents multi dimensional approaches for material identification applied on experimental X-ray measurements obtained with CdTe spectrometric detector. LETI has been developing a 16 channels fast read-out electronics capable to perform spectrometric measurements at count rates above 107 counts/s. The read-out electronics was coupled to CdTe linear array pixel detectors. A multidimensional analysis of the measured spectra has been developed to perform material identification. The results show a decrease of false detection rate by a factor up to 2 compared to an optimised dual counting approach applied on the same spectrometric raw data. Compared to a sandwich detector, the false detection rate is decreasing by a factor higher than 3 for thin objects. Generally, the paper demonstrates quantitatively the continuous performance and robustness increase with the number of detector energy channels.
Keywords
X-ray imaging; X-ray spectroscopy; readout electronics; semiconductor counters; CdTe X-rays spectrometric detector; CdTe spectrometric detector; X-ray measurements; detector energy channels; false detection rate; material identification methods; multidimensional analysis; read-out electronics; sandwich detector; Detectors; Materials; Object recognition; Photonics; Pixel; Radiation detectors; X-rays;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location
Knoxville, TN
ISSN
1095-7863
Print_ISBN
978-1-4244-9106-3
Type
conf
DOI
10.1109/NSSMIC.2010.5874546
Filename
5874546
Link To Document