DocumentCode
3536721
Title
Analysis of multilayered periodic structures with anisotropic media
Author
Takahashi, Kazuhiro ; Kitazawa, Toshihide
Author_Institution
Dept. of Electr. & Electron. Eng., Ibaraki Univ., Hitachi, Japan
Volume
2
fYear
1993
fDate
1993
Firstpage
15250
Abstract
An analytical method is presented for the plane wave scattering by periodic structures by using the extended spectral domain approach (ESDA). The effect of the finite metallization thickness of the periodic gratings can be taken into consideration, and the structures with multilayered anisotropic media can be treated easily. Accuracy and efficiency of the method is demonstrated by numerical computations
Keywords
electromagnetic wave scattering; spectral-domain analysis; analytical method; anisotropic media; extended spectral domain approach; finite metallization thickness; multilayered anisotropic media; multilayered periodic structures; periodic gratings; plane wave scattering; Anisotropic magnetoresistance; Apertures; Conductors; Dielectric substrates; Electromagnetic fields; Frequency selective surfaces; Gratings; Metallization; Periodic structures; Scattering; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings, 1993. APMC '93., 1993 Asia-Pacific
Conference_Location
Hsinchu
Print_ISBN
0-7803-1352-6
Type
conf
DOI
10.1109/APMC.1993.468655
Filename
468655
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