Title :
Performance improvement of 3-D position-sensitive pixellated HgI2 detectors when cooled from room temperature to 10 °C
Author :
Zhu, Yuefeng ; Kaye, Willy ; He, Zhong ; Zhang, Feng
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
An experiment to measure the performance of 3-D position-sensitive pixellated HgI2 crystals cooled below room temperature was carried out using a new ASIC from GammaMedica-Ideas. This ASIC is capable of reading out the digitized pre-amplifier signal waveforms of 121 pixels and the cathode. A significant improvement in energy resolution from 1.48% FWHM at 662keV for the whole detector to 1.09% FWHM is observed on a 18×18×11mm3 crystal at -4800V cathode bias when the ambient temperature is lowered from 70°F to 50°F (about 10°C). This resolution improvement is partly due to electronic noise reduction in the readout system. However, analysis of the pre-amplifier waveforms showed that changes in crystal properties played a more important role. A correlation between total electron trapping and energy resolution was identified. However, the amount of trapping was found irrelevant to crystal performance. Instead, the non-uniformity of charge collection, namely non-uniformity of the material defects, was believed to be the main contributor to crystal performance.
Keywords :
application specific integrated circuits; cathodes; mercury compounds; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3D position sensitive pixellated HgI2 detectors; ASIC; HgI2; cathode; detector performance improvement; digitized preamplifier signal waveforms; electron volt energy 662 keV; energy resolution; readout system electronic noise reduction; size 11 mm; size 18 mm; temperature 283.15 K to 298 K; total electron trapping; voltage -4800 V; Anodes; Charge carrier processes; Detectors; Energy resolution; Pixel; Semiconductor device measurement; Temperature measurement;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874558