DocumentCode :
3536793
Title :
Effect of interface roughness on exchange coupling in synthetic antiferromagnetic multilayers
Author :
Desai, M. ; Misra, A. ; Doyle, W.D.
Author_Institution :
Dept. of Phys., Alabama Univ., Tuscaloosa, AL, USA
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1323
Lastpage :
1324
Abstract :
In this work, FeCo/Ru/FeCo synthetic antiferromagnetic multilayers were deposited at ambient temperature on glass substrates under two different dc magnetron sputtering conditions which significantly changed the interface roughness. Interface roughness was calculated from X-ray reflectivity measurements. Angular dependent torque curves and hysteresis loops were calculated from energy minimization for a simple domain model assuming both bilinear and biquadratic exchange and were fitted to the experimental data. The effect on the reversal process and in particular, on the apparent exchange couplings, was found to be significant.
Keywords :
X-ray reflection; antiferromagnetic materials; cobalt alloys; exchange interactions (electron); interface roughness; iron alloys; magnetic hysteresis; magnetic multilayers; magnetisation reversal; ruthenium; sputtered coatings; torque; FeCo-Ru-FeCo; SiO2; X-ray reflectivity; angular dependent torque curves; bilinear exchange; biquadratic exchange; dc magnetron sputtering; domain model; energy minimization; exchange coupling; glass substrates; hysteresis loops; interface roughness; synthetic antiferromagnetic multilayers; Antiferromagnetic materials; Glass; Hysteresis; Magnetic domains; Magnetic multilayers; Nonhomogeneous media; Reflectivity; Sputtering; Temperature; Torque;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464091
Filename :
1464091
Link To Document :
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