DocumentCode :
3537015
Title :
Probabilistic marking estimation in labeled Petri nets
Author :
Cabasino, Maria Paola ; Hadjicostis, Christoforos N. ; Seatzu, C.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Cagliari, Cagliari, Italy
fYear :
2013
fDate :
10-13 Dec. 2013
Firstpage :
6304
Lastpage :
6310
Abstract :
Given a labeled Petri net, possibly with silent transitions, we are interested in performing current marking estimation in a probabilistic setting. We assume a known initial marking or a known finite set of initial markings, each with some a priori probability, and our goal is to obtain the conditional probabilities of possible current markings, conditioned on an observed sequence of labels. Under the assumptions that (i) the reachability set of the unobservable subnet of the given Petri net (starting from any possible initial state) is bounded (i.e., it has a finite number of reachable states), and (ii) a characterization of the a priori probabilities for occurrence of each transition enabled at each reachable marking is available, we develop a recursive algorithm that can perform current marking estimation online to efficiently obtain the probabilities of current states (conditioned on a sequence of observations). The proposed algorithm can be used in conjunction with a variety of supervisory control and fault diagnosis algorithms, in order to relax stringent constraints imposed by existing methodologies that typically rely solely on binary information regarding the possibility or impossibility of current states (but not their probabilities).
Keywords :
Petri nets; fault diagnosis; probability; conditional probabilities; control; fault diagnosis algorithms; labeled Petri nets; probabilistic marking estimation; reachability set; recursive algorithm; stringent constraint relaxation; unobservable subnet; Frequency modulation; Petri nets; Probabilistic logic; Probability; State estimation; Supervisory control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control (CDC), 2013 IEEE 52nd Annual Conference on
Conference_Location :
Firenze
ISSN :
0743-1546
Print_ISBN :
978-1-4673-5714-2
Type :
conf
DOI :
10.1109/CDC.2013.6760886
Filename :
6760886
Link To Document :
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