Title :
Load/unload processes for sub-5-nm flying height sliders
Author :
Kek, Ee-Ling ; Ma, Yansheng ; Sinha, Sujeet Kumar ; Liu, Bo
Author_Institution :
Data Storage Inst., Singapore, Singapore
Abstract :
The load/unload (L/UL) processes of relatively high flying height (FH) sliders have been studied extensively. The pitch static attitude (PSA), roll static attitude (RSA), L/UL velocities, disk RPM, suspension limiter, and slider air-bearing surface (ABS) design are important factors that can affect the L/UL performance significantly. It is inevitable that sliders are required to fly below 5 nm with the rapid increase in areal density. At such a low FH, it is a big challenge to L/UL a slider safely. However, L/UL process and slider design strategy for a safe L/UL of ultra-low FH sliders are seldom studied so far. In this paper, the effects of vertical L/UL velocities, disk RPM, PSA and RSA gram load, slider crown/camber and mask shifting in the slider manufacturing process on the L/UL performance of a sub-5-nm FH slider are studied. Then, a design guideline for better L/UL performance is proposed and its effectiveness is verified.
Keywords :
design engineering; hard discs; magnetic recording; 5 nm; air-bearing surface design; flying height sliders; load-unload process; mask shifting; pitch static attitude; roll static attitude; slider crown-camber; slider manufacturing process; suspension limiter; vertical load-unload velocities; Data engineering; Delay; Guidelines; Manufacturing processes; Memory; Performance analysis; Process design; Rails; Steady-state;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464129