DocumentCode :
3537251
Title :
Kinetics of atomic mechanisms of adsorption at the microwave vacuum - plasma deposition of submonolayer carbon coverings on silicon crystalss
Author :
Shanigin, V.Y. ; Yafarov, R.K.
Author_Institution :
Saratov Branch, Kotel´nikov Inst. of Radioeng. & Electron., Saratov, Russia
fYear :
2012
fDate :
19-20 Sept. 2012
Firstpage :
395
Lastpage :
401
Abstract :
Dependences of density of insular nanoeducations on temperature of sedimentation of submonolayer carbon coverings on silicon (100) crystals in the microwave plasma of fumes ethanol after a preliminary micromachining of plates in CF4 plasma and argon are investigated. It is established that after plasma micromachining in freon superficial density it is less, than after processing in argon, and they increase with temperature growth for freon and decreases for argon. It is shown that such nature of dependences testifies to existence of a precursor chemisorptions and is caused by various power of adsorption of carbon on the plates of the silicon which have passed preliminary micromachining in various chemically active environments.
Keywords :
adsorption; carbon; chemisorption; elemental semiconductors; micromachining; microwave materials processing; monolayers; plasma deposition; sedimentation; silicon; C; Si; adsorption; atomic mechanism; chemically active environments; freon superficial density; fume ethanol; insular nanoeducation; microwave vacuum plasma deposition; plasma micromachining; precursor chemisorptions; sedimentation temperature; silicon (100) crystals; submonolayer carbon; temperature growth; Adsorption;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4673-2096-2
Type :
conf
DOI :
10.1109/APEDE.2012.6478089
Filename :
6478089
Link To Document :
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