Title :
The cost effectiveness of reliability testing-What´s good and what´s not
Author :
Kramer, Stanley I.
Author_Institution :
Eaton Corp., Hauppauge, NY, USA
Abstract :
A discussion is presented of the shortcomings of several traditional reliability tests as applied to large systems. These include the reliability qualification test and the reliability development growth test. Alternatives are suggested to yield a greater return at less cost. Finally, a proposal is offered for a novel approach to the reliability warranty
Keywords :
electronic equipment testing; legislation; reliability; cost effectiveness; development growth test; qualification test; reliability testing; reliability warranty; Costs; Hardware; Job design; Maintenance; Performance evaluation; Production systems; Prototypes; Qualifications; System testing; Warranties;
Conference_Titel :
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location :
Atlanta, GA
DOI :
10.1109/ARMS.1989.49648
