• DocumentCode
    3537305
  • Title

    The cost effectiveness of reliability testing-What´s good and what´s not

  • Author

    Kramer, Stanley I.

  • Author_Institution
    Eaton Corp., Hauppauge, NY, USA
  • fYear
    1989
  • fDate
    24-26 Jan 1989
  • Firstpage
    470
  • Lastpage
    473
  • Abstract
    A discussion is presented of the shortcomings of several traditional reliability tests as applied to large systems. These include the reliability qualification test and the reliability development growth test. Alternatives are suggested to yield a greater return at less cost. Finally, a proposal is offered for a novel approach to the reliability warranty
  • Keywords
    electronic equipment testing; legislation; reliability; cost effectiveness; development growth test; qualification test; reliability testing; reliability warranty; Costs; Hardware; Job design; Maintenance; Performance evaluation; Production systems; Prototypes; Qualifications; System testing; Warranties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1989. Proceedings., Annual
  • Conference_Location
    Atlanta, GA
  • Type

    conf

  • DOI
    10.1109/ARMS.1989.49648
  • Filename
    49648
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3537305