DocumentCode :
3537310
Title :
The analysis fraktal characteristics of microscopic objects with WTMM method application
Author :
Volkov, Y.P. ; Bespalova, N.V. ; Khorovodova, N.Y.
Author_Institution :
Saratov State Tech. Univ., Saratov, Russia
fYear :
2012
fDate :
19-20 Sept. 2012
Firstpage :
422
Lastpage :
425
Abstract :
Article is devoted to research of fractal characteristics of microscopic objects with WTMM method application. The assessment of multifractal of studied images of surfaces is carried out.
Keywords :
fractals; object detection; wavelet transforms; WTMM method; fractal characteristics; microscopic object; multifractal assessment; surface image; Microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4673-2096-2
Type :
conf
DOI :
10.1109/APEDE.2012.6478093
Filename :
6478093
Link To Document :
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