DocumentCode :
3537491
Title :
Magnetic and electronic properties of Fe1.2Ti0.8O3/Fe2O3 bilayered films
Author :
Fujii, Tatsuo ; Takada, Yusuke ; Nakanishi, Masaki ; Takada, Jun
Author_Institution :
Dept. of Appl. Chem., Okayama Univ., Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1455
Lastpage :
1456
Abstract :
Bilayered films of Fe1.2Ti0.8O3/Fe2O3 were prepared on α-Al2O3(001) single-crystalline substrate using reactive sputtering technique. The magnetic and electronic properties of the films were characterized by X-ray diffraction (XRD), conversion electron Mossbauer spectroscopy (CEMS), vibrating sample magnetometer (VSM) and X-ray photoelectron spectroscopy (XPS).
Keywords :
Mossbauer effect; X-ray diffraction; X-ray photoelectron spectra; ferrimagnetic materials; interface magnetism; iron compounds; magnetic thin films; sputter deposition; Al2O3; Fe1.2Ti0.8O3-Fe2O3; VSM; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; bilayered films; conversion electron Mossbauer spectroscopy; electronic properties; magnetic properties; reactive sputtering technique; vibrating sample magnetometer; Iron; Magnetic films; Magnetic properties; Magnetization; Semiconductor films; Solid state circuits; Temperature; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464157
Filename :
1464157
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3537491
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