DocumentCode
3537739
Title
Distributed estimation of binary event probabilities via hierarchical Bayes and dual decomposition
Author
Coluccia, Angelo ; Notarstefano, Giuseppe
Author_Institution
Dept. of Eng., Univ. del Salento (Univ. of Lecce), Lecce, Italy
fYear
2013
fDate
10-13 Dec. 2013
Firstpage
6753
Lastpage
6758
Abstract
In this paper we consider a network of monitors that can count the occurrences of binary events of interest. The aim is to estimate both the local event probabilities and some global features of the system as, e.g., the mean probability. This scenario is motivated by several applications in cyber-physical systems and social networks. We propose a hierarchical Bayesian approach in which the individual event probabilities are treated as random variables with an a priori density function. Following the empirical Bayes approach, the prior is chosen in a family of distributions parameterized by suitable unknown hyperparameters. We develop a distributed optimization algorithm, as a variant of a standard distributed dual decomposition scheme, to obtain locally the Maximum Likelihood estimates of the hyperparameters. These estimates allow each monitor to gain accuracy in both the local and global estimation tasks. This approach is particularly well suited in scenarios in which the number of samples at each node are allowed to be highly inhomogeneous.
Keywords
Bayes methods; distributed algorithms; maximum likelihood estimation; optimisation; a priori density function; binary event probabilities distributed estimation; distributed optimization algorithm; dual decomposition; empirical Bayes approach; global estimation tasks; hierarchical Bayes; hierarchical Bayesian approach; hyperparameters; local estimation tasks; local event probabilities; maximum likelihood estimates; random variables; standard distributed dual decomposition scheme; Accuracy; Bayes methods; Maximum likelihood estimation; Monitoring; Optimization; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control (CDC), 2013 IEEE 52nd Annual Conference on
Conference_Location
Firenze
ISSN
0743-1546
Print_ISBN
978-1-4673-5714-2
Type
conf
DOI
10.1109/CDC.2013.6760959
Filename
6760959
Link To Document