• DocumentCode
    3537913
  • Title

    Photoinjection currents in polymers and electronic charge-exchange at the interface in insulating composites

  • Author

    Kawamoto, A. ; Suzuoki, Y. ; Ikejiri, T. ; Mizutani, T. ; Ieda, M.

  • Author_Institution
    Fukui Nat. Coll. of Technol., Sabae, Japan
  • fYear
    1995
  • fDate
    17-20 Sep 1995
  • Firstpage
    169
  • Lastpage
    172
  • Abstract
    In the composites of PS(polystyrene) and PMMA( polymethyl-methacrylate), electrons transported from the PMMA layer can pass through the interface more easily than holes from the PMMA layer. Holes from the PS layer can pass through the interface more easily than electrons from the PS layer. As exemplified above, the charge-exchange rate at the interface in insulating composites is affected by the direction of the carrier transport. These asymmetric characteristics are widely seen in insulating composites, such as epoxy-alumina, and seem very important for the better understanding of the insulation performance of the composites. The photoinjection current technique was utilized in order to estimate the conduction levels in PS and PMMA. In this paper, the charge-exchange processes at the polymer-polymer interface are discussed mainly on the basis of the conduction levels in polymers
  • Keywords
    charge exchange; composite insulating materials; conduction bands; interface states; organic insulating materials; photoconductivity; polymer films; PMMA; charge-exchange rate; conduction levels; electronic charge-exchange; insulating composites; photoinjection current technique; polymer-polymer interface; polymers; polymethyl-methacrylate; polystyrene; Aluminum; Charge carrier processes; Current measurement; Educational institutions; Electrodes; Gold; Photoconductivity; Plastic insulation; Polymers; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 1995. International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    4-88686-047-8
  • Type

    conf

  • DOI
    10.1109/ISEIM.1995.496535
  • Filename
    496535